Surface Science
Scanning Probe Microscopy
X-Ray Diffraction
Nuclear Magnetic Resonance
Thin Film
Optical Characterisation
Electrical/Magnetic Characterisation
Thermal Analysis
Sample Preparation-General
Sample Preparation-Electron_Microscopy
Element Analysis
Nano Fabrication
Liquid Helium Plant
Scanning Electron Microscopy-SEM
Transmission Electron Microscopy-TEM
Aberration Corrected TEM
Model:
JEM-ARM200F (JEOL)
Status:
Operational
Location:
2212
Description:
JEM-ARM200F TEM with probe corrector and cold field emission gun. STEM-HAADF resolution: 83 pm; Selectable HT: 200kV, 80kV, 60kV and 30kV; EDS with dual SDD detectors; GATAN Enfinium EELS spectrometer with dual EELS capabilities; Tomography
Remark:
1) NO Biological/Magnetic/Contaminated/Organic samples 2) For authorized users ONLY; 3) 2 days cancellation ----- Violation the rules will be disqualified!
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